Explain timing and testability concepts

Quick Overview

This question evaluates a candidate's understanding of digital timing and testability concepts—specifically setup and hold timing, clock skew impacts, mitigation of setup/hold violations, and test methodologies such as scan, DFT and MBIST—within backend digital implementation contexts.

Explain timing and testability concepts

Company: Arm

Role: Backend Engineer

Category: Software Engineering Fundamentals

Difficulty: medium

Interview Round: Onsite

For a digital implementation or backend-focused interview, explain the following concepts: 1. What are **setup time** and **hold time**? 2. How does **clock skew** affect setup and hold timing? 3. What are common ways to fix **setup violations** and **hold violations**? 4. What do **scan**, **DFT (Design for Test)**, and **MBIST** mean, and why are they used? Give definitions, describe the practical impact on chip timing closure and testability, and mention common engineering trade-offs.

Quick Answer: This question evaluates a candidate's understanding of digital timing and testability concepts—specifically setup and hold timing, clock skew impacts, mitigation of setup/hold violations, and test methodologies such as scan, DFT and MBIST—within backend digital implementation contexts.

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Mar 13, 2026, 12:00 AM
mediumBackend EngineerOnsiteSoftware Engineering Fundamentals
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For a digital implementation or backend-focused interview, explain the following concepts:

  1. What are setup time and hold time ?
  2. How does clock skew affect setup and hold timing?
  3. What are common ways to fix setup violations and hold violations ?
  4. What do scan , DFT (Design for Test) , and MBIST mean, and why are they used?

Give definitions, describe the practical impact on chip timing closure and testability, and mention common engineering trade-offs.

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